In 2022, the dominating segment for computer vision (CV) was quality assurance and inspection because of the rapid adoption of process automation in the manufacturing industry. One of the key benefits ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

A new study explores deep learning for image-based defect detection during 3D printing, looking to catch bad builds.

As advanced packaging pushes deeper into the sub-10µm realm, traditional inspection and metrology systems are being forced to evolve with it. Hybrid bonding, a critical enabler of vertical integration ...